Resolving the internal structure of individual atmospheric aerosol particle by the combination of Atomic Force Microscopy, ESEM–EDX, Raman and ToF–SIMS imaging by S. Sobanska & G. Falgayrac & J. Rimetz-Planchon & E. Perdrix & C. Brémard & J. Barbillat

Resolving the internal structure of individual atmospheric aerosol particle by the combination of Atomic Force Microscopy, ESEM–EDX, Raman and ToF–SIMS imaging by S. Sobanska & G. Falgayrac & J. Rimetz-Planchon & E. Perdrix & C. Brémard & J. Barbillat

Author:S. Sobanska & G. Falgayrac & J. Rimetz-Planchon & E. Perdrix & C. Brémard & J. Barbillat
Format: pdf
Tags: Single particle imaging, AFM, Raman Microspectrometry, ToF/SIMS, ESEM/EDX, Internal particle structure
Publisher: Elsevier B.V.
Published: 2014-02-15T14:04:19+00:00


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